A new method to measure the distance between graduation lines on graduated scales. - William B. Penzes; Richard A. Allen; Michael W. Cresswell; Loren W. Linholm; E. Clayton Teague (IEEE Trans. Instrum. Meas., 2000)

Application of conformal mapping approximation techniques: parallel conductors of finite dimensions. - Nadine Pesonen; Walter K. Kahn; Richard A. Allen; Michael W. Cresswell; Mona E. Zaghloul (IEEE Trans. Instrum. Meas., 2004)

Modeling and simulation of resistivity of nanometer scale copper. - A. Emre Yarimbiyik; Harry A. Schafft; Richard A. Allen; Mona E. Zaghloul; David L. Blackburn (Microelectron. Reliab., 2006)

Comparison of SEM and HRTEM CD Measurements Extracted From Test Structures Having Feature Linewidths From 40 to 240 nm. - Michael W. Cresswell; Richard A. Allen; William F. Guthrie; Christine E. Murabito; Ronald G. Dixson; Amy Hunt (IEEE Trans. Instrum. Meas., 2008)

Mobile microrobot characterization through performance-based competitions. - Jason J. Gorman; Craig D. McGray; Richard A. Allen (PerMIS, 2009)

Experimental and simulation studies of resistivity in nanoscale copper films. - A. Emre Yarimbiyik; Harry A. Schafft; Richard A. Allen; Mark D. Vaudin; Mona E. Zaghloul (Microelectron. Reliab., 2009)

A Dynamic Uncertainty Protocol for Digital Sensor Networks. - Michael Gaitan; Richard A. Allen; Jon Geist; Akobuije Chijioke (MetroInd4.0&IoT, 2021)