Bayesian Estimation of Density via Multiple Sequential Inversions of Two-Dimensional Images With Application to Electron Microscopy. - Dalia Chakrabarty; Nare Gabrielyan; Fabio Rigat; Richard Beanland; Shashi Paul (Technometrics, 2015)

Partial Scan Electron Microscopy with Deep Learning. - Jeffrey M. Ede; Richard Beanland (CoRR, 2019)

Exit Wavefunction Reconstruction from Single Transmisson Electron Micrographs with Deep Learning. - Jeffrey M. Ede; Jonathan J. P. Peters; Jeremy Sloan; Richard Beanland (CoRR, 2020)

Adaptive learning rate clipping stabilizes learning. - Jeffrey M. Ede; Richard Beanland (Mach. Learn. Sci. Technol., 2020)