State-space analysis and identification for a class of hysteretic systems. - Reinder Banning; Willem L. De Koning; Han J. M. T. A. Adriaens; Richard K. Koops (Autom., 2001)

Modeling, identification and control of a metrological Atomic Force Microscope with a 3DOF stage. - Roel J. E. Merry; Mustafa Uyanik; Richard K. Koops; René van de Molengraft; Marijn van Veghel; Maarten Steinbuch (ACC, 2008)

Modeling and compensation of asymmetric hysteresis in a piezo actuated metrological AFM. - Roel J. E. Merry; Mustafa Uyanik; René van de Molengraft; Maarten Steinbuch; Richard K. Koops; Marijn van Veghel (ACC, 2009)

Multivariable control of a metrological Atomic Force Microscope. - Michael J. C. Ronde; Roel J. E. Merry; Marinus Jacobus Gerardus van de Molengraft; Richard K. Koops; Maarten Steinbuch (ECC, 2009)

Directional Repetitive Control of a Metrological AFM. - Roel J. E. Merry; Michael J. C. Ronde; René van de Molengraft; Richard K. Koops; Maarten Steinbuch (IEEE Trans. Control. Syst. Technol., 2011)