Towards a Traceable Infrastructure for Low Force Measurements. - Richard K. Leach; Christopher W. Jones (IPAS, 2008)

Application of a DFµA Methodology to facilitate the assembly of a Micro/Nano Measurement Device. - Carsten Tietje; Richard K. Leach; Michele Turitto; Ronaldo Ronaldo; Svetan M. Ratchev (IPAS, 2008)

Modelling the Interaction Forces between an Ideal Measurement Surface and the Stylus Tip of a Novel Vibrating Micro-scale CMM Probe. - James D. Claverley; A. Georgi; Richard K. Leach (IPAS, 2010)

Utilisation of FIB/SEM Technology in the Assembly of an Innovative Micro-CMM Probe. - Daniel Smale; Steve Haley; Joel Segal; Ronaldo Ronaldo; Svetan M. Ratchev; Richard K. Leach; James D. Claverley (IPAS, 2010)

Semi-automated Assembly of a MEMS-Based Micro-scale CMM Probe and Future Optimization of the Process Chain with a View to Desktop Factory Automation. - James D. Claverley; Arne Burisch; Richard K. Leach; Annika Raatz (IPAS, 2012)

Testing the Mechanical Characteristics and Contacting Behaviour of Novel Manufactured and Assembled Sphere-Tipped Styli for Micro-CMM Probes. - Dong-Yea Sheu; James D. Claverley; Richard K. Leach (IPAS, 2014)

Performance Assessment of a New Variable Stiffness Probing System for Micro-CMMs. - Khalid Alblalaihid; Peter Kinnell; Simon Lawes; Dorian Desgaches; Richard K. Leach (Sensors, 2016)

Digital Preservation of the Nottingham Ichthyosaur Using Fringe Projection. - Petros Stavroulakis; Yael Bis-Kong; Elodie Doyen; Thomas Hartman; Richard K. Leach (EuroMed (2), 2018)

Information-Rich Manufacturing Metrology. - Richard K. Leach; Patrick Bointon; Xiaobing Feng 004; Simon Lawes; Samanta Piano; Nicola Senin; Danny Sims-Waterhouse; Petros Stavroulakis; Rong Su 002; Wahyudin P. Syam; Matthew Thomas (IPAS, 2018)

External Shape Measurement for Industrial Applications Using Artificial Intelligence and Optimised Data Fusion. - Petros Stavroulakis; Danny Sims-Waterhouse; Amrozia Shaheen; Sofia Catalucci; Patrick Bointon; Elodie Doyen; Yael Bis-Kong; Yorgos Tzimiropoulos; Richard K. Leach (IntelliSys (2), 2018)

Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level. - Yassir Arezki; Rong Su 002; Ville Heikkinen; François Leprete; Pavel Psota; Youichi Bitou; Christian Schober; Charyar-Mehdi Souzani; Bandar Abdulrahman Mohammed Alzahrani; Xiangchao Zhang; Yohan Kondo; Christof Pruss; et al. (Sensors, 2021)

Predistorting Projected Fringes for High-Accuracy 3-D Phase Mapping in Fringe Projection Profilometry. - Jian Wang 089; Zonghua Zhang; Richard K. Leach; Wenlong Lu; Jianfeng Xu (IEEE Trans. Instrum. Meas., 2021)

Real-time target alignment system for high-power high-repetition rate laser operations using a five degree-of-freedom hybrid mechanism. - Shah Karim; Samanta Piano; David T. Branson; Teguh Santoso; Richard K. Leach; Martin Tolley (Int. J. Control, 2022)

Detailed Three-Dimensional Building Façade Reconstruction: A Review on Applications, Data and Technologies. - Anna Klimkowska; Stefano Cavazzi; Richard K. Leach; Stephen Grebby (Remote. Sens., 2022)

Stitching Locally Fitted T-Splines for Fast Fitting of Large-Scale Freeform Point Clouds. - Jian Wang 089; Sheng Bi; Wenkang Liu; Liping Zhou; Tukun Li; Iain MacLeod; Richard K. Leach (Sensors, 2023)

Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology. - Helia Hooshmand; Tobias Pahl; Poul Erik Hansen; Liwei Fu; Alexander Birk; Mirza Karamehmedovic; Peter Lehmann; Stephan Reichelt; Richard K. Leach; Samanta Piano (J. Comput. Phys., 2025)