Optimizing the Cost of Test at Intel Using per Device Data. - Robert Edmondson; Gregory Iovino; Richard Kacprowicz (ITC, 2006)

Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs. - Sudarshan Bahukudumbi; Krishnendu Chakrabarty; Richard Kacprowicz (DATE, 2008)