Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter. - Gerard Coquery; S. Carubelli; Jean-Pierre Ousten; Richard Lallemand; Frederic Lecoq; Dominique Lhotellier; V. de Viry; Philippe Dupuy (Microelectron. Reliab., 2001)

High temperature reliability on automotive power modules verified by power cycling tests up to 150degreeC. - Gerard Coquery; Guy Lefranc; T. Licht; Richard Lallemand; Norbert Seliger; H. Berg (Microelectron. Reliab., 2003)

Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode. - Laurent Dupont 002; J. L. Blanchard; Richard Lallemand; Gerard Coquery; Jean-Michel Morelle; G. Blondel; B. Rouleau (Microelectron. Reliab., 2010)

Study of Accelerated Aging of Supercapacitors for Transport Applications. - A. Hammar; Pascal Venet; Richard Lallemand; Gerard Coquery; Gérard Rojat (IEEE Trans. Ind. Electron., 2010)

Influence of thermal cycling on supercapacitor performance fading during ageing test at constant voltage. - Mohamed Ayadi; Olivier Briat; Richard Lallemand; Gerard Coquery; Jean-Michel Vinassa (ISIE, 2014)

Description of supercapacitor performance degradation rate during thermal cycling under constant voltage ageing test. - Mohamed Ayadi; Olivier Briat; Richard Lallemand; Akram Eddahech; Ronan German; Gerard Coquery; Jean-Michel Vinassa (Microelectron. Reliab., 2014)

Power cycling issues and challenges of SiC-MOSFET power modules in high temperature conditions. - Ali Ibrahim; Jean-Pierre Ousten; Richard Lallemand; Zoubir Khatir (Microelectron. Reliab., 2016)

Power module thermal cycling tester for in-situ ageing detection. - Philippe Pougnet; Gerard Coquery; Richard Lallemand; A. Makhloufi (Microelectron. Reliab., 2017)