Improving Total IC Design Quality Using Application Mode Testing. - R. Mehtani; M. De Jonghe; Richard Morren; Keith Baker (ITC, 1992)

Using EDIF for Transfer of Test Data: Practical Experience. - Bas Verhelst; Richard Morren; Keith Baker (ITC, 1992)

Mix Test: A Mixed-Signal Extension to a Digital Test System. - R. Mehtani; Bert Atzema; M. De Jonghe; Richard Morren; Geert Seuren; Taco Zwemstra (ITC, 1993)

Definition of a robust modular SOC test architecture; resurrection of the single TAM daisy-chain. - Tom Waayers; Richard Morren; Roberto Grandi (ITC, 2005)

Clock control architecture and ATPG for reducing pattern count in SoC designs with multiple clock domains. - Tom Waayers; Richard Morren; Xijiang Lin; Mark Kassab (ITC, 2010)

Industrial Application of IEEE P1687 for an Automotive Product. - Martin Keim; Tom Waayers; Richard Morren; Friedrich Hapke; Rene Krenz-Baath (DSD, 2013)