Acoustic velocity measurements in the air by means of Laser Doppler Velocimetry: Cramér-Rao Bounds and Maximum Likelihood Estimation. - Alain Le Duff; Guy Plantier; Jean-Christophe Valière; Richard Perdriau (ICASSP, 2002)

Early Prediction of Conducted-Mode Emission of complex IC's. - Anne-Marie Trullemans-Anckaert; Richard Perdriau; Mohammed Ramdani 002; Jean-Luc Levant (FDL, 2004)

ICEM modelling of microcontroller current activity. - Jean-Luc Levant; Mohammed Ramdani 002; Richard Perdriau (Microelectron. J., 2004)

An EMC-oriented VHDL-AMS simulation methodology for dynamic current activity assessment. - Richard Perdriau; Mohammed Ramdani 002; Jean-Luc Levant; Eric Tinlot; Anne-Marie Trullemans-Anckaert (Microelectron. J., 2004)

Electrical modeling of inductive links for high-efficiency energy transmission. - Mondher Chaoui; Hamadi Ghariani; Mongi Lahiani; Richard Perdriau; Mohammed Ramdani 002; Fayçal Sellami (ICECS, 2005)

Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits. - Ali Alaeldine; Nicolas Lacrampe; Alexandre Boyer; Richard Perdriau; Fabrice Caignet; Mohammed Ramdani 002; Etienne Sicard; M'hamed Drissi (Microelectron. J., 2008)

A comprehensive simulation model for immunity prediction in integrated circuits with respect to substrate injection. - Ali Alaeldine; Richard Perdriau; Ali Haidar (Microelectron. J., 2009)

Immunity Modeling of Integrated Circuits: An Industrial Case. - Frédéric Lafon; François de Daran; Mohammed Ramdani 002; Richard Perdriau; M'hamed Drissi (IEICE Trans. Commun., 2010)

Electrical modeling of the sensitivity to misalignments of a class-E based inductive transcutaneous link. - Mondher Chaoui; Richard Perdriau; Hamadi Ghariani; Mongi Lahiani (Microelectron. J., 2012)

Kron simulation of field-to-line coupling using a meshed and a modified Taylor cell. - Sjoerd Op't Land; Richard Perdriau; Mohammed Ramdani 002; Olivier Maurice; M'hamed Drissi (EMC Compo, 2013)

Direct power injection on functional and non-functional signals of SPI EEPROM memories. - Mohammed Amellall; Sjoerd Op't Land; Richard Perdriau; Mohammed Ramdani 002; Ali Ahaitouf; M'hamed Drissi (EMC Compo, 2015)

Impact of Field Polarization on Radiated Emission Characterization in an Open TEM Cell. - Mohsen Koohestani; Mohamed Ramdani 002; Frédéric Lafon; Antonio A. Moreira; Richard Perdriau (IEEE Trans. Instrum. Meas., 2020)

Trustworthy SoC Reconfiguration Aimed at Product-Service Systems: a Literature Review. - Maxime Méré; Frédéric Jouault; Loïc Pallardy; Richard Perdriau (COINS, 2022)

Feedback on the formal verification of UML models in an industrial context: the case of a smart device life cycle management system. - Maxime Méré; Frédéric Jouault; Loïc Pallardy; Richard Perdriau (MoDELS, 2022)

Modeling Trust Relationships in Blockchain Applications: The Case of Reconfigurable Systems-on-Chip. - Maxime Méré; Frédéric Jouault; Loïc Pallardy; Richard Perdriau (QRS Companion, 2022)

Experimental Characterization of Multitone EM Immunity of Integrated Oscillators Under Thermal Stress. - Qazi Mashaal Khan; Lokesh Devaraj; Richard Perdriau; Alastair R. Ruddle; Tim Claeys; Mohamed Ramdani 002; Mohsen Koohestani (IEEE Access, 2022)

A Case Study for the EMC Co-Simulation of Injection Path Model Using WR Method. - Md. Moktarul Alam; Richard Perdriau; Mohammed Ramdani 002; Mohsen Koohestani (EMC Compo, 2024)

Improvements proposed to noisy-OR derivatives for multi-causal analysis: A case study of simultaneous electromagnetic disturbances. - Lokesh Devaraj; Qazi Mashaal Khan; Alastair R. Ruddle; Alistair P. Duffy; Richard Perdriau; Mohsen Koohestani (Int. J. Approx. Reason., 2024)

Relaxation Parameter Optimization in Electrical-to-Mechanical Co-Simulation Based on Time Windowing WR Technique. - Md. Moktarul Alam; Richard Perdriau; Mohammed Ramdani 002; Mohsen Koohestani (IEEE Access, 2025)

Evaluating formal model verification tools in an industrial context: the case of a smart device life cycle management system. - Maxime Méré; Frédéric Jouault; Loïc Pallardy; Richard Perdriau (Softw. Syst. Model., 2025)