Enhanced Timing-Based Transition Delay Testing for Small Delay Defects. - Richard Putman; Rahul Gawde (VTS, 2006)

Using Multiple Expansion Ratios and Dependency Analysis to Improve Test Compression. - Richard Putman; Nur A. Touba (VTS, 2007)

Using reiterative LFSR based X-masking to increase output compression in presence of unknowns. - Richard Putman (ACM Great Lakes Symposium on VLSI, 2008)

Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation. - Ritesh Garg; Richard Putman; Nur A. Touba (VTS, 2008)