High Resolution IDDQ Characterization and Testing - Practical Issues. - Alan W. Righter; Jerry M. Soden; Richard W. Beegle (ITC, 1996)

Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. - Edward I. Cole Jr.; Jerry M. Soden; Paiboon Tangyunyong; Patrick L. Candelaria; Richard W. Beegle; Daniel L. Barton; Christopher L. Henderson; Charles F. Hawkins (ITC, 1997)

IMEMS accelerometer testing-test laboratory development and usage. - Richard W. Beegle; Robert W. Brocato; Ronald W. Grant (ITC, 1999)