A parallel sort-balance mutual range-join algorithm on hypercube computers. - Richard Wong; Rodney W. Topor; Hong Shen 001 (Microprocess. Microsystems, 1998)

Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. - Damien Leroy; Rémi Gaillard; Erwin Schäfer; Cyrille Beltrando; Shi-Jie Wen; Richard Wong (IOLTS, 2008)

Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. - Sanghyeon Baeg; Shi-Jie Wen; Richard Wong (IEEE Trans. Circuits Syst. I Regul. Pap., 2010)

Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS. - David Rennie; David Li 002; Manoj Sachdev; Bharat L. Bhuva; Srikanth Jagannathan; Shi-Jie Wen; Rick Wong (CICC, 2011)

Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS. - Massoud Mokhtarpour Ghahroodi; Mark Zwolinski; Rick Wong; Shi-Jie Wen (ETS, 2011)

Quantitative SEU Fault Evaluation for SRAM-Based FPGA Architectures and Synthesis Algorithms. - Naifeng Jing; Ju-Yueh Lee; Zhe Feng 002; Weifeng He; Zhigang Mao; Shi-Jie Wen; Rick Wong; Lei He 001 (FPL, 2011)

Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations. - Changmin Jung; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong (ISQED, 2011)

Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS. - Jian Liu 027; Xin Wang 031; Hui Zhao 014; Qiang Fang; Albert Z. Wang; Lin Lin 011; He Tang; Siqiang Fan; Bin Zhao 002; Shi-Jie Wen; Richard Wong (IEEE J. Solid State Circuits, 2011)

Mitigating the effects of large multiple cell upsets (MCUs) in memories. - Juan Antonio Maestro; Pedro Reviriego; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong (ACM Trans. Design Autom. Electr. Syst., 2011)

Heterogeneous configuration memory scrubbing for soft error mitigation in FPGAs. - Ju-Yueh Lee; Cheng-Ru Chang; Naifeng Jing; Juexiao Su; Shi-Jie Wen; Rick Wong; Lei He 001 (FPT, 2012)

Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter. - Yi Ren; L. Fan; Li Chen 001; Shi-Jie Wen; Richard Wong; N. W. van Vonno; Arthur F. Witulski; Bharat L. Bhuva (J. Electron. Test., 2012)

Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS. - David Rennie; David Li 002; Manoj Sachdev; Bharat L. Bhuva; Srikanth Jagannathan; Shi-Jie Wen; Richard Wong (IEEE Trans. Circuits Syst. I Regul. Pap., 2012)

Networking industry trends in ESD protection for high speed IOs. - Richard Wong; Rita Fung; Shi-Jie Wen (ASICON, 2013)

Placement of repair circuits for in-field FPGA repair. - Michael J. Wirthlin; Joshua E. Jensen; Alex Wilson; William Howes; Shi-Jie Wen; Rick Wong (FPGA, 2013)

Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance. - Hao Xie; Li Chen 001; Adrian Evans; Shi-Jie Wen; Rick Wong (PRDC, 2013)

Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller. - Yi Ren; Shuting Shi; Li Chen 001; Haibin Wang; L.-J. Gao; Gang Guo; Shi-Jie Wen; Richard Wong; N. W. van Vonno (J. Electron. Test., 2013)

Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication. - Juan Antonio Maestro; Pedro Reviriego; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong (Microprocess. Microsystems, 2013)

New approaches for synthesis of redundant combinatorial logic for selective fault tolerance. - Hao Xie; Li Chen 001; Rui Liu 011; Adrian Evans; Dan Alexandrescu; Shi-Jie Wen; Rick Wong (IOLTS, 2014)

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser. - Yi Ren; Anlin He; Shuting Shi; Gang Guo; Li Chen 001; Shi-Jie Wen; Richard Wong; N. W. van Vonno; Bharat L. Bhuva (J. Electron. Test., 2014)

Single Event Resilient Dynamic Logic Designs. - Haibin Wang; Mulong Li; Li Chen 001; Rui Liu 011; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong; Rita Fung; Jinshun Bi (J. Electron. Test., 2014)

Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams. - GeunYong Bak; Soonyoung Lee; Hosung Lee; Kyungbae Park; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong; Charlie Slayman (IRPS, 2015)

Analysis of advanced circuits for SET measurement. - Rui Liu 011; Adrian Evans; Qiong Wu; Yuanqing Li; Li Chen 001; Shi-Jie Wen; Rick Wong; Rita Fung (IRPS, 2015)

Terrestrial SER characterization for nanoscale technologies: A comparative study. - Nihaar N. Mahatme; Bharat L. Bhuva; Nelson J. Gaspard; T. Assis; Y. Xu; P. Marcoux; M. Vilchis; Balaji Narasimham; A. Shih; Shi-Jie Wen; Rick Wong; N. Tam; et al. (IRPS, 2015)

New insights into the impact of SEUs in FPGA CRAMs. - Sheng Wang; Adrian Evans; Shi-Jie Wen; Rick Wong; GengSheng Chen (IEICE Electron. Express, 2015)

NBTI Lifetime Evaluation and Extension in Instruction Caches. - Shengyu Duan; Basel Halak; Rick Wong; Mark Zwolinski (ERMAVSS@DATE, 2016)

Rectifeye: a vision-correcting system for virtual reality. - Pierre-Yves Laffont; Tobias Martin; Markus H. Gross; Wei De Tan; C. T. Lim; Affa Au; Rick Wong (SIGGRAPH Asia Posters, 2016)

IZIP: In-place zero overhead interconnect protection via PIP redundancy. - Yi Luo; Adrian Evans; Shi-Jie Wen; Rick Wong; GengSheng Chen (ASICON, 2017)

BPPT - Bulk potential protection technique for hardened sequentials. - Issam Nofal; Adrian Evans; Anlin He; Gang Guo; Yuanqing Li; Li Chen 001; Rui Liu 011; Haibin Wang; Mo Chen 008; Sang H. Baeg; Shi-Jie Wen; Richard Wong (IOLTS, 2017)

Single-event effects on optical transceiver. - Kurt J. Lezon; Shi-Jie Wen; Y.-F. Dan; Richard Wong; Bharat L. Bhuva (IRPS, 2018)

A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning. - Somnath Kundu; Muqing Liu; Richard Wong; Shi-Jie Wen; Chris H. Kim (ISSCC, 2018)

Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. - Yuanqing Li; Li Chen 001; Issam Nofal; Mo Chen 008; Haibin Wang; Rui Liu 011; Qingyu Chen; Milos Krstic; Shuting Shi; Gang Guo; Sang H. Baeg; Shi-Jie Wen; et al. (Microelectron. Reliab., 2018)

Study of proton radiation effect to row hammer fault in DDR4 SDRAMs. - Chul Seung Lim; Kyungbae Park; GeunYong Bak; Donghyuk Yun; Myungsang Park; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong (Microelectron. Reliab., 2018)

Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. - Jingchen Cao; Lyuan Xu; Bharat L. Bhuva; Shi-Jie Wen; Richard Wong; Balaji Narasimham; Lloyd W. Massengill (IRPS, 2019)

Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology. - Lyuan Xu; Jingchen Cao; Bharat L. Bhuva; Indranil Chatterjee; Shi-Jie Wen; Richard Wong; Lloyd W. Massengill (IRPS, 2019)

A Fully Integrated Digital LDO With Built-In Adaptive Sampling and Active Voltage Positioning Using a Beat-Frequency Quantizer. - Somnath Kundu; Muqing Liu; Shi-Jie Wen; Richard Wong; Chris H. Kim (IEEE J. Solid State Circuits, 2019)

A Distributed Testbed for 5G Scenarios: An Experimental Study. - Mohammad Kazem Chamran; Kok-Lim Alvin Yau; Rafidah Md. Noor; Richard Wong (Sensors, 2020)

Dynamic access control method for SDP-based network environments. - Hyunjin You; Doochan Ko; Daniel Kim; Richard Wong; Inwhee Joe (EURASIP J. Wirel. Commun. Netw., 2023)

Enhancing Maritime Data Integration for Platform Services With Sequence-to-Sequence Models and Statistical Refinement. - Hyoseong Hwang; Richard Wong; Ducsun Lim; Jonggu Kang; Inwhee Joe (IEEE Access, 2025)