BIST of interconnection lines in the pixel matrix of CMOS imagers. - Richun Fei; Jocelyn Moreau; Salvador Mir (IWASI, 2013)

Horizontal-FPN fault coverage improvement in production test of CMOS imagers. - Richun Fei; Jocelyn Moreau; Salvador Mir; Alexis Marcellin; C. Mandier; E. Huss; G. Palmigiani; P. Vitrou; Thomas Droniou (VTS, 2015)