Replacing Error Vector Magnitude Test with RF and Analog BISTs. - Dallas Webster; Rick Hudgens; Donald Y. C. Lie (IEEE Des. Test Comput., 2011)

Methodology to Replace Sensitivity BER and Transmit Power Production Tests in Bluetooth Devices with BiSTs. - Deepa Mannath; David Cohen; Victor Montaño-Martinez; Rick Hudgens; Elida de-Obaldia; Shai Kush; Simon S. Ang (J. Electron. Test., 2011)

Maximizing Parallel Testing in an FM Receiver. - Mozar Naing; Dallas Webster; Nolan Blue; Rick Hudgens; Zahir Parkar; Sumeer Bhatara; Pankaj Gupta; Donald Y. C. Lie (J. Electron. Test., 2012)