SiGe BiCMOS Trends - Today and Tomorrow. - James S. Dunn; David L. Harame; Alvin J. Joseph; Stephen A. St. Onge; Natalie B. Feilchenfeld; Louis D. Lanzerotti; Bradley A. Orner; Ephrem G. Gebreselasie; Jeffrey B. Johnson; Douglas D. Coolbaugh; Rick Rassel; Marwan Khater (CICC, 2006)

Ballast Resistor Temperature Effect and Ruggedness. - Yves Ngu; Ephrem G. Gebreselasie; Rajendran Krishnasamy; Rick Rassel (BCICTS, 2019)