Voltage Surges by Backside ESD Impacts on IC Chip in Flip Chip Packaging. - Takuya Wadatsumi; Kohei Kawai; Rikuu Hasegawa; Takuji Miki; Makoto Nagata; Kikuo Muramatsu; Hiromu Hasegawa; Takuya Sawada; Takahito Fukushima; Hisashi Kondo (IRPS, 2022)

Characterization of Backside ESD Impacts on Integrated Circuits. - Takuya Wadatsumi; Kohei Kawai; Rikuu Hasegawa; Kazuki Monta; Takuji Miki; Makoto Nagata (IRPS, 2023)

Experimental Exploration of the Backside ESD Impacts on an IC Chip in Flip Chip Packaging. - Takuya Wadatsumi; Kohei Kawai; Rikuu Hasegawa; Kikuo Muramatsu; Hiromu Hasegawa; Takuya Sawada; Takahito Fukushima; Hisashi Kondo; Takuji Miki; Makoto Nagata (IEICE Trans. Electron., 2023)

Thermal Flow Simuation and Measurements of 3D Si Chip Stacks with TSVs. - Shuhei Yokota; Rikuu Hasegawa; Kazuki Monta; Takaaki Okidono; Takuji Miki; Makoto Nagata (3DIC, 2024)

A Hybrid Simulation Approach for Accurate and Fast System-Level Side-Channel Leakage Evaluation. - Kazuki Monta; Takafumi Oki; Rikuu Hasegawa; Takuya Wadatsumi; Takuji Miki; Makoto Nagata; Lang Lin; Norman Chang (AsianHOST, 2024)

On-Chip Evaluation of Voltage Drops and Fault Occurrence Induced by Si Backside EM Injection. - Rikuu Hasegawa; Kazuki Monta; Takuya Wadatsumi; Takuji Miki; Makoto Nagata (COSADE, 2024)

Modeling and Analysis of On-Chip Voltage Fluctuations Caused by Electromagnetic Fault Injection. - Takuya Wadatsumi; Rikuu Hasegawa; Kazuki Monta; Takuji Miki; Lang Lin; Norman Chang; Makoto Nagata (EMC Compo, 2024)

Fault Injection Attacks Exploiting High Voltage Pulsing over Si-Substrate Backside of IC chips. - Yusuke Hayashi; Rikuu Hasegawa; Takuya Wadatsumi; Kazuki Monta; Takuji Miki; Makoto Nagata (FDTC, 2024)

Si-Backside Side-Channel Leakage Measurement and Simulation. - Rikuu Hasegawa; Kazuki Monta; Takuya Wadatsumi; Takuji Miki; Makoto Nagata; Lang Lin; Akhilesh Kumar; Norman Chang (ISOCC, 2024)

ML-EMFI: A Machine Learning-Driven Pre-Silicon Electromagnetic Fault Injection Security Evaluation for Robust IC Design. - Pantha Protim Sarker; Tianze Kan; Jingchen Liang; Ozgur Tuncer; Bo He; Zelin Lu; Sudarshan Mallu; Lang Lin; Norman Chang; Rikuu Hasegawa; Kazuki Monta; Makoto Nagata; et al. (HOST, 2025)