Modeling Patent Quality: A System for Large-scale Patentability Analysis using Text Mining. - Shohei Hido; Shoko Suzuki; Risa Nishiyama; Takashi Imamichi; Rikiya Takahashi; Tetsuya Nasukawa; Tsuyoshi Idé; Yusuke Kanehira; Rinju Yohda; Takeshi Ueno; Akira Tajima; Toshiya Watanabe (J. Inf. Process., 2012)