Networking industry trends in ESD protection for high speed IOs. - Richard Wong; Rita Fung; Shi-Jie Wen (ASICON, 2013)

Single Event Resilient Dynamic Logic Designs. - Haibin Wang; Mulong Li; Li Chen 001; Rui Liu 011; Sanghyeon Baeg; Shi-Jie Wen; Richard Wong; Rita Fung; Jinshun Bi (J. Electron. Test., 2014)

Analysis of advanced circuits for SET measurement. - Rui Liu 011; Adrian Evans; Qiong Wu; Yuanqing Li; Li Chen 001; Shi-Jie Wen; Rick Wong; Rita Fung (IRPS, 2015)

Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology. - Jingchen Cao; Lyuan Xu; Shi-Jie Wen; Rita Fung; Balaji Narasimham; Lloyd W. Massengill; Bharat L. Bhuva (IRPS, 2020)

Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System. - Andrew M. Keller; Jared Anderson; Michael J. Wirthlin; Shi-Jie Wen; Rita Fung; Conner Chambers (IRPS, 2020)

Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. - Lyuan Xu; Jingchen Cao; John Brockman; Carlo Cazzaniga; Christopher Frost 002; Shi-Jie Wen; Rita Fung; Bharat L. Bhuva (IRPS, 2020)

High-Current State triggered by Operating-Frequency Change. - Lyuan Xu; Jingchen Cao; Shi-Jie Wen; Rita Fung; Jamie Markevitch; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2020)

Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology. - Alexandra Feeley; Yoni Xiong; Bharat L. Bhuva; Balaji Narasimham; Shi-Ji Wen; Rita Fung (IRPS, 2021)

Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node. - Yoni Xiong; Alexandra Feeley; Lloyd W. Massengill; Bharat L. Bhuva; Shi-Jie Wen; Rita Fung (IRPS, 2021)

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. - Yoni Xiong; Alexandra Feeley; Nicholas J. Pieper; Dennis R. Ball; Balaji Narasimham; John Brockman; N. A. Dodds; S. A. Wender; Shi-Jie Wen; Rita Fung; Bharat L. Bhuva (IRPS, 2022)

Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems. - Nicholas J. Pieper; M. Chun; Yoni Xiong; H. M. Dattilo; Jenna B. Kronenberg; Sanghyeon Baeg; Shi-Jie Wen; Rita Fung; D. Chan; C. Escobar; Bharat L. Bhuva (IRPS, 2024)