In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. - Robert Madge; Brady Benware; Ritesh P. Turakhia; W. Robert Daasch; Chris Schuermyer; Jens Ruffler (ITC, 2004)

Defect Screening Using Independent Component Analysis on I_DDQ. - Ritesh P. Turakhia; Brady Benware; Robert Madge; Thaddeus T. Shannon; W. Robert Daasch (VTS, 2005)

Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. - Ritesh P. Turakhia; W. Robert Daasch; Joel Lurkins; Brady Benware (IEEE Des. Test Comput., 2006)

Silicon evaluation of longest path avoidance testing for small delay defects. - Ritesh P. Turakhia; W. Robert Daasch; Mark Ward; John Van Slyke (ITC, 2007)

Effective and Efficient Test Pattern Generation for Small Delay Defect. - Sandeep Kumar Goel; Narendra Devta-Prasanna; Ritesh P. Turakhia (VTS, 2009)

Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study. - Ritesh P. Turakhia; Mark Ward; Sandeep Kumar Goel; Brady Benware (VTS, 2009)