Internal processes in power semiconductors at virtual junction temperature measurement. - Weinan Chen; Jörg Franke; Christian Herold; Riteshkumar Bhojani; Josef Lutz (Microelectron. Reliab., 2016)

Requirements in power cycling for precise lifetime estimation. - Christian Herold; Jörg Franke; Riteshkumar Bhojani; Andre Schleicher; Josef Lutz (Microelectron. Reliab., 2016)

Unified view on energy and electrical failure of the short-circuit operation of IGBTs. - Roman Baburske; Franz-Josef Niedernostheide; Hans-Joachim Schulze; Riteshkumar Bhojani; J. Kowalsky; Josef Lutz (Microelectron. Reliab., 2018)