Impact of Work Function Fluctuations on Threshold Voltage Variability in a Nanoscale FinFETs. - Rituraj Singh Rathore; Rajneesh Sharma; Ashwani K. Rana (iNIS, 2016)

Impact of High-k Spacer on Device Performance of Nanoscale Underlap Fully Depleted SOI MOSFET. - Rajneesh Sharma; Rituraj S. Rathore; Ashwani K. Rana (J. Circuits Syst. Comput., 2018)

Analysis of Source-and-Drain Doping for the Underlapped FinFET. - Rituraj S. Rathore; Viranjay M. Srivastava (COINS, 2024)