A view of a user-oriented production test data generation system. - Peter S. Bottorff; Robert A. Rasmussen (DAC, 1970)

Delay test generation. - E. R. Hsieh; Robert A. Rasmussen; L. J. Vidunas; W. T. Davis (DAC, 1977)

Automated Testing of LSI. - Robert A. Rasmussen (Computer, 1982)

Chip partitioning aid: A design technique for partitionability and testability in VLSI. - Subrata Dasgupta; M. C. Graf; Robert A. Rasmussen; Ron G. Walther; Tom W. Williams (DAC, 1984)