Technology Scaling Trends and Accelerated Testing for Soft Errors in Commercial Silicon Devices. - Robert Baumann (IOLTS, 2003)

Soft Errors in Advanced Computer Systems. - Robert Baumann (IEEE Des. Test Comput., 2005)

Data publication: Boosting electrode performance and bubble management via Direct Laser Interference Patterning. - Hannes Rox; Fabian Ränke; Jonathan Mädler; Mateusz M. Marzec; Krystian Sokolowski; Robert Baumann; Homa Hamedi; Xuegeng Yang; Gerd Mutschke; Leon Urbas; Andrés Fabián Lasagni; Kerstin Eckert (RODARE, 2024)