A 45nm SOI compiled embedded DRAM with random cycle times down to 1.3ns. - Mark Jacunski; Darren Anand; Robert Busch; John A. Fifield; Matthew Lanahan; Paul Lane; Adrian Paparelli; Gary Pomichter; Dale E. Pontius; Michael Roberge; Stephen Sliva (CICC, 2010)

Modeling Gully Erosion Susceptibility to Evaluate Human Impact on a Local Landscape System in Tigray, Ethiopia. - Robert Busch; Jacob Hardt; Nadav Nir; Brigitta Schütt (Remote. Sens., 2021)