Aliasing probability of non-exhaustive randomized syndrome tests. - Robert C. Aitken; Vinod K. Agarwal (ICCAD, 1988)

A diagnosis method using pseudo-random vectors without intermediate signatures. - Robert C. Aitken; Vinod K. Agarwal (ICCAD, 1989)

: Experiments on Aliasing in Signature Analysis Registers. - Dhiren Xavier; Robert C. Aitken; André Ivanov; Vinod K. Agarwal (ITC, 1989)

Fault Location with Current Monitoring. - Robert C. Aitken (ITC, 1991)

The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%? - Peter C. Maxwell; Robert C. Aitken; Vic Johansen; Inshen Chiang (ITC, 1991)

A Comparison of Defect Models for Fault Location with IDDQ Measurements. - Robert C. Aitken (ITC, 1992)

The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need? - Peter C. Maxwell; Robert C. Aitken; Vic Johansen; Inshen Chiang (ITC, 1992)

Diagnosis of leakage faults with IDDQ. - Robert C. Aitken (J. Electron. Test., 1992)

IDDQ testing as a component of a test suite: The need for several fault coverage metrics. - Peter C. Maxwell; Robert C. Aitken (J. Electron. Test., 1992)

Using an asymmetric error model to study aliasing in signature analysis registers. - Dhiren Xavier; Robert C. Aitken; André Ivanov; Vinod K. Agarwal (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)

BP-1992 A Comparison of Defect Models for Fault Location with IDDQ Measurements. - Robert C. Aitken (ITC, 1993)

Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. - Peter C. Maxwell; Robert C. Aitken (ITC, 1993)

Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. - Peter C. Maxwell; Robert C. Aitken (IEEE Des. Test Comput., 1993)

The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. - Peter C. Maxwell; Robert C. Aitken; Leendert M. Huisman (ITC, 1994)

Finding Defects with Fault Models. - Robert C. Aitken (ITC, 1995)

An Overview of Test Synthesis Tools. - Robert C. Aitken (IEEE Des. Test Comput., 1995)

Modelling the Unmodellable: Algorithmic Fault Diagnosis. - Robert C. Aitken (ITC, 1996)

IDDQ and AC Scan: The War Against Unmodelled Defects. - Peter C. Maxwell; Robert C. Aitken; Kathleen R. Kollitz; Allen C. Brown (ITC, 1996)

Volume Manufacturing - ICs and Boards: DFT to the Rescue? - Robert C. Aitken; J. Hutcheson; N. Murthy; Phil Nigh; Nicholas Sporck (VTS, 1996)

When tools cry wolf: Testability pitfalls of synthesized designs. - Robert C. Aitken (IEEE Des. Test Comput., 1996)

So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. - Phil Nigh; Wayne M. Needham; Kenneth M. Butler; Peter C. Maxwell; Robert C. Aitken; Wojciech Maly (ITC, 1997)

Power Dissipation During Testing: Should We Worry About it? - Vishwani D. Agrawal; Robert C. Aitken; J. Braden; Joan Figueras; S. Kumar; Hans-Joachim Wunderlich; Yervant Zorian (VTS, 1997)

An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. - Phil Nigh; Wayne M. Needham; Kenneth M. Butler; Peter C. Maxwell; Robert C. Aitken (VTS, 1997)

Modeling the Unmodelable: Algorithmic Fault Diagnosis. - Robert C. Aitken (IEEE Des. Test Comput., 1997)

How will CAD handle billion-transistor systems? (panel). - Robert C. Aitken; Jason Cong; Randy Harr; Kenneth L. Shepard; Wayne H. Wolf (ICCAD, 1998)

On-chip versus off-chip test: an artificial dichotomy. - Robert C. Aitken (ITC, 1998)

It Makes Sense to Combine DFT and DFR/DFY. - Robert C. Aitken (ITC, 1999)

Trends in SLI design and their effect on test. - Robert C. Aitken; Fidel Muradali (ITC, 1999)

Current ratios: a self-scaling technique for production I_DDQ testing. - Peter C. Maxwell; Pete O'Neill; Robert C. Aitken; Ronald Dudley; Neal Jaarsma; Minh Quach; Don Wiseman (ITC, 1999)

Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage. - Robert C. Aitken (VTS, 1999)

Nanometer Technology Effects on Fault Models for IC Testing. - Robert C. Aitken (Computer, 1999)

Current ratios: a self-scaling technique for production IDDQ testing. - Peter C. Maxwell; Pete O'Neill; Robert C. Aitken; Ronald Dudley; Neal Jaarsma; Minh Quach; Don Wiseman (ITC, 2000)

Test Generation and Fault Modeling for Stress Testing (invited). - Robert C. Aitken (ISQED, 2002)

Wireless Test. - Robert C. Aitken; Mustapha Slamani; H. Ding; William R. Eisenstadt; Sanghoon Choi; John McLaughlin (VTS, 2002)

Test as a Key Enabler for Faster Yield Ramp-Up. - Julie Segal; Rene Segers; Rob Aitken; S. Eichenberge; A. Gattike; M. Millegen; R. Seger; S. Venkataraman (VTS, 2002)

Guest Editors' Introduction: Stressing the Fundamentals. - Robert C. Aitken; Donald L. Wheater (IEEE Des. Test Comput., 2002)

Redundancy, Repair, and Test Features of a 90nm Embedded SRAM Generator. - Rob Aitken; Neeraj Dogra; Dhrumil Gandhi; Scott Becker (DFT, 2003)

DFM: The Real 90nm Hurdle. - Robert C. Aitken (ITC, 2003)

Silicon IP And Successful DFM. - Robert C. Aitken (ITC, 2003)

Applying Defect-Based Test to Embedded Memories in a COT Model. - Robert C. Aitken (MTDT, 2003)

Guest editorial - testing and verification of communication system-on-chip devices. - Dimitris Gizopoulos; Robert C. Aitken (IEEE Commun. Mag., 2003)

ITC 2003: Breaking Test Interface Bottlenecks. - Robert C. Aitken; Gordon W. Roberts (IEEE Des. Test Comput., 2003)

ITC Highlights. - Gordon W. Roberts; Robert C. Aitken (IEEE Des. Test Comput., 2003)

From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions. - Robert C. Aitken; Fidel Muradali (DATE, 2004)

A Modular Wrapper Enabling High Speed BIST and Repair for Small Wide Memories. - Robert C. Aitken (ITC, 2004)

Redundancy & It's Not Just for Defects Anymore. - Robert C. Aitken (MTDT, 2004)

Test at Gbps: Megaproblem or micromanagement? - Rob Aitken (IEEE Des. Test Comput., 2004)

ITC 2003 Roundtable: Design for Manufacturability. - Rob Aitken; Stefan Eichenberger; Gary Maier; Sandip Kundu; Hank Walker (IEEE Des. Test Comput., 2004)

ITC 2003 panels: Part 1. - Carol Stolicny; Tapio Koivukangas; Rubin A. Parekhji; Ian G. Harris; Rob Aitken (IEEE Des. Test Comput., 2004)

Noise and reliability containment approaches. - Gordon W. Roberts; Robert C. Aitken (CICC, 2005)

ESD implementation strategies. - Mike Zachariah; Robert C. Aitken (CICC, 2005)

Modeling Soft-Error Susceptibility for IP Blocks. - Robert C. Aitken; Betina Hold (IOLTS, 2005)

ITC is Cool. - Robert C. Aitken (IEEE Des. Test Comput., 2005)

Low-power design tools: are EDA vendors taking this matter seriously? - Enrico Macii; Massoud Pedram; Dirk Friebel; Robert C. Aitken; Antun Domic; Roberto Zafalon (DATE, 2006)

Reliability Issues for Embedded SRAM at 90nm and Below. - Robert C. Aitken (IOLTS, 2006)

DFM Metrics for Standard Cells. - Robert C. Aitken (ISQED, 2006)

The Design and Validation of IP for DFM/DFY Assurance. - Robert C. Aitken (ITC, 2006)

Low Power Methodology Manual - for System-on-Chip Design. - Michael Keating; David Flynn; Robert C. Aitken; Alan Gibbons; Kaijian Shi (Springer, 2007)

Test Roles in Diagnosis and Silicon Debug. - Anis Uzzaman; Fidel Muradali; Takashi Aikyo; Robert C. Aitken; Tom Jackson; Rajesh Galivanche; Takeshi Onodera (ATS, 2007)

Worst-case design and margin for embedded SRAM. - Robert C. Aitken; Sachin Idgunji (DATE, 2007)

DFM/DFY: should you trust the surgeon or the family doctor? - Marco Casale-Rossi; Andrzej J. Strojwas; Robert C. Aitken; Antun Domic; Carlo Guardiani; Philippe Magarshack; Douglas Pattullo; Joseph Sawicki (DATE, 2007)

Defect or Variation? Characterizing Standard Cell Behavior at 90nm and below. - Robert C. Aitken (ISQED, 2007)

Guest Editorial: Special Section on "Autonomous Silicon Validation and Testing of Microprocessors and Microprocessor-Based Systems". - Dimitris Gizopoulos; Robert C. Aitken; Sandip Kundu (IEEE Trans. Very Large Scale Integr. Syst., 2007)

DFM in practice: hit or hype? - Juan C. Rey; N. S. Nagaraj; Andrew B. Kahng; Fabian Klass; Rob Aitken; Cliff Hou; Luigi Capodieci; Vivek Singh (DAC, 2008)

Panel Session - Caution Ahead: The Road to Design and Manufacturing at 32 and 22 nm. - S. Turnoy; Peter Wintermayr; Robert C. Aitken; Rudy Lauwereins; J. Tracy Weed; V. Kiefer; J. Hartmann (DATE, 2008)

Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS. - Vikas Chandra; Robert C. Aitken (DFT, 2008)

More Moore: foolish, feasible, or fundamentally different? - Rob Aitken; Jerry Bautista; Wojciech Maly; Jan M. Rabaey (ICCAD, 2008)

Special Session 4: Reliability and Circuit Simulation. - Rob Aitken (IOLTS, 2008)

Guest Editors' Introduction: Addressing the Challenges of Debug and Diagnosis. - Rob Aitken; Erik Jan Marinissen (IEEE Des. Test Comput., 2008)

Addressing design margins through error-tolerant circuits. - Shidhartha Das; David T. Blaauw; David M. Bull; Krisztián Flautner; Rob Aitken (DAC, 2009)

Impact of voltage scaling on nanoscale SRAM reliability. - Vikas Chandra; Robert C. Aitken (DATE, 2009)

The challenges of correlating silicon and models in high variability CMOS processes. - Robert C. Aitken (ISPD, 2009)

DFX and Productivity. - Robert C. Aitken (VLSI Design, 2009)

Post-silicon is too late avoiding the $50 million paperweight starts with validated designs. - John Goodenough 001; Rob Aitken (DAC, 2010)

Who solves the variability problem? - Nagaraj Ns; Juan C. Rey; Jamil Kawa; Robert C. Aitken; Christian Lütkemeyer; Vijay Pitchumani; Andrzej J. Strojwas; Steve Trimberger (DAC, 2010)

On the efficacy of write-assist techniques in low voltage nanoscale SRAMs. - Vikas Chandra; Cezary Pietrzyk; Robert C. Aitken (DATE, 2010)

Analytical model for TDDB-based performance degradation in combinational logic. - Mihir R. Choudhury; Vikas Chandra; Kartik Mohanram; Robert C. Aitken (DATE, 2010)

TIMBER: Time borrowing and error relaying for online timing error resilience. - Mihir R. Choudhury; Vikas Chandra; Kartik Mohanram; Robert C. Aitken (DATE, 2010)

A black box method for stability analysis of arbitrary SRAM cell structures. - Michael Wieckowski; Dennis Sylvester; David T. Blaauw; Vikas Chandra; Sachin Idgunji; Cezary Pietrzyk; Robert C. Aitken (DATE, 2010)

Asymmetric 6T SRAM with two-phase write and split bitline differential sensing for low voltage operation. - Satyanand Nalam; Vikas Chandra; Cezary Pietrzyk; Robert C. Aitken; Benton H. Calhoun (ISQED, 2010)

Modeling the impact of process variation on resistive bridge defects. - S. Saqib Khursheed; Shida Zhong; Robert C. Aitken; Bashir M. Al-Hashimi; Sandip Kundu (ITC, 2010)

Time to retire our benchmarks. - Rob Aitken (IEEE Des. Test Comput., 2010)

High-Performance Multiprocessor System on Chip: Trends in Chip Architecture for the Mass Market. - Rob Aitken; Krisztián Flautner; John Goodacre (Multiprocessor System-on-Chip, 2011)

On the impact of gate oxide degradation on SRAM dynamic and static write-ability. - Vikas Chandra; Robert C. Aitken (ASP-DAC, 2011)

Correlating models and silicon for improved parametric yield. - Rob Aitken; Greg Yeric; David Flynn (DATE, 2011)

Analytical model for SRAM dynamic write-ability degradation due to gate oxide breakdown. - Vikas Chandra; Robert C. Aitken (DATE, 2011)

Dynamic write limited minimum operating voltage for nanoscale SRAMs. - Satyanand Nalam; Vikas Chandra; Robert C. Aitken; Benton H. Calhoun (DATE, 2011)

Variation-aware static and dynamic writability analysis for voltage-scaled bit-interleaved 8-T SRAMs. - Daeyeon Kim; Vikas Chandra; Robert C. Aitken; David T. Blaauw; Dennis Sylvester (ISLPED, 2011)

VLSI Test technology: Why is the field not sexy enough? - Said Hamdioui; Rob Aitken (ETS, 2012)

An adaptive write word-line pulse width and voltage modulation architecture for bit-interleaved 8T SRAMs. - Daeyeon Kim; Vikas Chandra; Robert C. Aitken; David T. Blaauw; Dennis Sylvester (ISLPED, 2012)

Panel: going green across communications and storage systems: control of power in non-mobile devices. - Kenneth Wagner; Martin St. Laurent; Robert C. Aitken; Hugh Barrass; Randall Robinson (ISLPED, 2012)

Yield Learning Perspectives. - Rob Aitken (IEEE Des. Test Comput., 2012)

The past present and future of design-technology co-optimization. - Greg Yeric; Brian Cline; Saurabh Sinha; David Pietromonaco; Vikas Chandra; Rob Aitken (CICC, 2013)

Reliability analysis reloaded: how will we survive? - Robert C. Aitken; Görschwin Fey; Zbigniew T. Kalbarczyk; Frank Reichenbach; Matteo Sonza Reorda (DATE, 2013)

Leveraging sensitivity analysis for fast, accurate estimation of SRAM dynamic write VMIN. - James Boley; Vikas Chandra; Robert C. Aitken; Benton H. Calhoun (DATE, 2013)

SlackProbe: a low overhead in situ on-line timing slack monitoring methodology. - Liangzhen Lai; Vikas Chandra; Robert C. Aitken; Puneet Gupta 001 (DATE, 2013)

Welcome message. - Gordon W. Roberts; Rob Aitken (ITC, 2013)

Hot topic session 4A: Reliability analysis of complex digital systems. - Adrian Evans; Michael Nicolaidis; Rob Aitken; Burcin Aktan; Olivier Lauzeral (VTS, 2013)

Panel: Emerging vs. established technologies, a two sphinxes' riddle at the crossroads? - Marco Casale-Rossi; Giovanni De Micheli; Rob Aitken; Antun Domic; Manfred Horstmann; Robert Hum; Philippe Magarshack (DATE, 2014)

Mobile hardware security. - Vikas Chandra; Rob Aitken (Hot Chips Symposium, 2014)

DFM is dead - Long live DFM. - Robert C. Aitken; David Pietromonaco; Brian Cline (ICCD, 2014)

Modeling SRAM dynamic VMIN. - James Boley; Benton H. Calhoun; Vikas Chandra; Robert C. Aitken (ICICDT, 2014)

A digital dynamic write margin sensor for low power read/write operations in 28nm SRAM. - Peter Beshay; Vikas Chandra; Rob Aitken; Benton H. Calhoun (ISLPED, 2014)

Physical design and FinFETs. - Robert C. Aitken; Greg Yeric; Brian Cline; Saurabh Sinha; Lucian Shifren; Imran Iqbal; Vikas Chandra (ISPD, 2014)

BTI-Gater: An Aging-Resilient Clock Gating Methodology. - Liangzhen Lai; Vikas Chandra; Robert C. Aitken; Puneet Gupta 001 (IEEE J. Emerg. Sel. Topics Circuits Syst., 2014)

Time-Borrowing Circuit Designs and Hardware Prototyping for Timing Error Resilience. - Mihir R. Choudhury; Vikas Chandra; Robert C. Aitken; Kartik Mohanram (IEEE Trans. Computers, 2014)

SlackProbe: A Flexible and Efficient In Situ Timing Slack Monitoring Methodology. - Liangzhen Lai; Vikas Chandra; Robert C. Aitken; Puneet Gupta 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

Session 12 - Tutorial - beyond CMOS: Large area electronics-concepts and prospects. - Robert C. Aitken; Tetsuya Iizuka (CICC, 2015)

Circuit design perspectives for Ge FinFET at 10nm and beyond. - Saurabh Sinha; Lucian Shifren; Vikas Chandra; Brian Cline; Greg Yeric; Robert C. Aitken; Bingjie Cheng; Andrew R. Brown; Craig Riddet; C. Alexandar; Campbell Millar; Asen Asenov (ISQED, 2015)

Panel: Is design-for-security the new DFT? - Rob Aitken (VTS, 2015)

Resiliency challenges in sub-10nm technologies. - Rob Aitken; Ethan H. Cannon; Mondira Pant; Mehdi Baradaran Tahoori (VTS, 2015)

No Fault Found: The root cause. - Erik Larsson; Bill Eklow; Scott Davidsson; Rob Aitken; Artur Jutman; Christophe Lotz (VTS, 2015)

Resiliency in dynamically power managed designs. - Liangzhen Lai; Vikas Chandra; Rob Aitken (ICCAD, 2016)

Coordinating Communication, Technology and Design in the IOT Era. - Rob Aitken (ISLPED, 2016)

A 400mV active VMIN, 200mV retention VMIN, 2.8 GHz 64Kb SRAM with a 0.09 um2 6T bitcell in a 16nm FinFET CMOS process. - Azeez Bhavnagarwala; Imran Iqbal; An Nguyen; David Ondricek; Vikas Chandra; Robert C. Aitken (VLSI Circuits, 2016)

Test implications and challenges in near threshold computing special session. - Mehdi Baradaran Tahoori; Rob Aitken; Sriram R. Vangal; Bal Sandhu (VTS, 2016)

Predicting future complementary metal-oxide-semiconductor technology - challenges and approaches. - Robert C. Aitken; Vikas Chandra; Brian Cline; Shidhartha Das; David Pietromonaco; Lucian Shifren; Saurabh Sinha; Greg Yeric (IET Comput. Digit. Tech., 2016)

Foreword. - Maria K. Michael; Rolf Drechsler; Stephan Eggersglüß; Haralampos-G. D. Stratigopoulos; Sybille Hellebrand; Rob Aitken (ETS, 2017)

The road to a trillion: Making the IoT work. - Rob Aitken (VLSI-DAT, 2017)

Automating Energy Demand Modeling and Forecasting Using Smart Meter Data. - Poojitha Amin; Ludmila Cherkasova; Rob Aitken; Vikas Kache (ICIOT, 2019)

Analysis and Demand Forecasting of Residential Energy Consumption at Multiple Time Scales. - Poojitha Amin; Ludmila Cherkasova; Rob Aitken; Vikas Kache (IM, 2019)

Challenges and Opportunities for Efficient Serverless Computing at the Edge. - Phani Kishore Gadepalli; Gregor Peach; Ludmila Cherkasova; Rob Aitken; Gabriel Parmer (SRDS, 2019)

56th Design Automation Conference Report. - Robert C. Aitken (IEEE Des. Test, 2019)

Special Section on Emerging Trends and Design Paradigms for Memory Systems and Storage. - Rob Aitken; Cecilia Metra (IEEE Trans. Emerg. Top. Comput., 2019)

Towards efficient processing of latency-sensitive serverless DAGs at the edge. - Xiaosu Lyu; Ludmila Cherkasova; Robert C. Aitken; Gabriel Parmer; Timothy Wood 001 (EdgeSys@EuroSys, 2022)

Research Challenges for Energy-Efficient Computing in Automated Vehicles. - Robert P. Dick; Rob Aitken; Jace Mogill; John Paul Strachan; Kirk Bresniker; Wei Lu 003; Yorie Nakahira; Zhiyong Li; Matthew J. Marinella; William Severa; A. Alec Talin; Craig M. Vineyard; et al. (Computer, 2023)

VLSI Test and Trust Roundtable. - Ramesh Karri; Janusz Rajski; Rob Aitken; Subhasish Mitra; Mark Tehranipoor (IEEE Des. Test, 2024)

Special Issue on Hot Chips 2024. - Rob Aitken; Larry Yang (IEEE Micro, 2025)