Neutron-induced 10B fission as a major source of soft errors in high density SRAMs. - Robert C. Baumann; Eric B. Smith (Microelectron. Reliab., 2001)

An Overview of the Risk Posed by Thermal Neutrons to the Reliability of Computing Devices. - Daniel Oliveira 002; Sean Blanchard; Nathan DeBardeleben; Fermando Santos; Gabriel Piscoya Dávila; Philippe Olivier Alexandre Navaux; Stephen Wender; Carlo Cazzaniga; Christopher Frost 002; Robert C. Baumann; Paolo Rech (DSN (Supplements), 2020)

Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications. - Daniel Oliveira 002; Sean Blanchard; Nathan DeBardeleben; Fernando Fernandes dos Santos; Gabriel Piscoya Dávila; Philippe O. A. Navaux; Carlo Cazzaniga; Christopher Frost 002; Robert C. Baumann; Paolo Rech (ETS, 2020)

Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation. - Rodolfo A. Rodriguez-Davila; L. Fernandez-Izquierdo; J. Fink; T. Moise; Robert C. Baumann; B. Gnade; Manuel Quevedo-Lopez; Chadwin D. Young (IRPS, 2024)