Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures. - Robert Entner; Tibor Grasser; Oliver Triebl; Hubert Enichlmair; Rainer Minixhofer (Microelectron. Reliab., 2007)

VSP - A gate stack analyzer. - Markus Karner; Andreas Gehring; M. Wagner; Robert Entner; Stefan Holzer; Wolfgang Goes; M. Vasicek; Tibor Grasser; Hans Kosina; Siegfried Selberherr (Microelectron. Reliab., 2007)