Rule-based data mining for yield improvement in semiconductor manufacturing. - Sholom M. Weiss; Robert J. Baseman; Fateh Tipu; Christopher N. Collins; William A. Davies; Raminderpal Singh; John W. Hopkins (Appl. Intell., 2010)

Improving quality control by early prediction of manufacturing outcomes. - Sholom M. Weiss; Amit Dhurandhar; Robert J. Baseman (KDD, 2013)

Continuous prediction of manufacturing performance throughout the production lifecycle. - Sholom M. Weiss; Amit Dhurandhar; Robert J. Baseman; Brian F. White; Ronald Logan; Jonathan K. Winslow; Daniel J. Poindexter (J. Intell. Manuf., 2016)

A System and Benchmark for LLM-based Q&A on Heterogeneous Data. - Achille Fokoue; Srideepika Jayaraman; Elham Khabiri; Jeffrey O. Kephart; Yingjie Li; Dhruv Shah; Youssef Drissi; Fenno F. Terry Heath III; Anuradha Bhamidipaty; Fateh Tipu; Robert J. Baseman (CoRR, 2024)