Conduction band states of transition metal (TM) high-k gate dielectrics as determined from X-ray absorption spectra. - Gerald Lucovsky; J. G. Hong; Charles C. Fulton; N. A. Stoute; Y. Zou; Robert J. Nemanich; David E. Aspnes; H. Ade; D. G. Schlom (Microelectron. Reliab., 2005)

Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability. - Michael J. Mutch; Thomas Pomorski; Brad C. Bittel; Corey J. Cochrane; Patrick M. Lenahan; Xin Liu; Robert J. Nemanich; Justin Brockman; Marc French; Markus Kuhn; Benjamin French; Sean W. King (Microelectron. Reliab., 2016)

Diamond-BN Heterojunctions for High Power Devices: The Ultimate HEMT? - Ankita Ankita; Mihilat Manahile; Shih-Chun Tsu; Ali Ebadi Yekta; Terry Alford; Stephen M. Goodnick; Robert J. Nemanich; Trevor J. Thornton (BCICTS, 2024)