Comparative Factory Analysis of Standard FOUP Capacities. - Kranthi Mitra Adusumilli; Robert L. Wright (WSC, 2004)

An analysis: traditional semiconductor lithography versus emerging technology (nano imprint). - Walter J. Trybula; Robert L. Wright; Kranthi Mitra Adusumilli; Randy K. Goodall (WSC, 2005)

High speed semiconductor fab simulation for large, medium and small lot sizes. - Peter C. Bosch; Robert L. Wright (WSC, 2008)