Testability-Driven Random Test-Pattern Generation. - Robert Lisanke; Franc Brglez; Aart J. de Geus; David Gregory (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1987)

A modular scan-based testability system. - Franc Brglez; David Bryan; John D. Calhoun; Robert Lisanke (ICCD, 1988)

McMAP: a fast technology mapping procedure for multi-level logic synthesis. - Robert Lisanke; Franc Brglez; Gershon Kedem (ICCD, 1988)