Neighbor selection for variance reduction in I_DDQ and other parametric data. - W. Robert Daasch; Kevin Cota; James McNames; Robert Madge (ITC, 2001)

Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. - W. Robert Daasch; Kevin Cota; James McNames; Robert Madge (ITC, 2002)

Screening MinVDD Outliers Using Feed-Forward Voltage Testing. - Robert Madge; B. H. Goh; V. Rajagopalan; C. Macchietto; W. Robert Daasch; Chris Schuermyer; C. Taylor; David Turner (ITC, 2002)

Isolating and Removing Sources of Variation in Test Data. - David Turner; David Abercrombie; James McNames; W. Robert Daasch; Robert Madge (ITC, 2002)

Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. - Robert Madge; Manu Rehani; Kevin Cota; W. Robert Daasch (VTS, 2002)

Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort. - W. Robert Daasch; James McNames; Robert Madge; Kevin Cota (IEEE Des. Test Comput., 2002)

Creating Value Through Test. - Erik Jan Marinissen; Bart Vermeulen; Robert Madge; Michael Kessler; Michael Müller (DATE, 2003)

Impact of Multiple-Detect Test Patterns on Product Quality. - Brady Benware; Chris Schuermyer; Sreenevasan Ranganathan; Robert Madge; Prabhu Krishnamurthy; Nagesh Tamarapalli; Kun-Han Tsai; Janusz Rajski (ITC, 2003)

Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. - Chris Schuermyer; Brady Benware; Kevin Cota; Robert Madge; W. Robert Daasch; L. Ning (ITC, 2003)

Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. - Brady Benware; Robert Madge; Cam Lu; W. Robert Daasch (VTS, 2003)

Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. - Robert Madge; Brady Benware; W. Robert Daasch (IEEE Des. Test Comput., 2003)

Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. - Brady Benware; Cam Lu; John Van Slyke; Prabhu Krishnamurthy; Robert Madge; Martin Keim; Mark Kassab; Janusz Rajski (ITC, 2004)

ATE Value Add through Open Data Collection. - Robert Madge (ITC, 2004)

In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. - Robert Madge; Brady Benware; Ritesh P. Turakhia; W. Robert Daasch; Chris Schuermyer; Jens Ruffler (ITC, 2004)

ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. - Manu Rehani; David Abercrombie; Robert Madge; Jim Teisher; Jason Saw (ITC, 2004)

Detection of Temperature Sensitive Defects Using ZTC. - Ethan Long; W. Robert Daasch; Robert Madge; Brady Benware (VTS, 2004)

Variance reduction and outliers: statistical analysis of semiconductor test data. - W. Robert Daasch; Robert Madge (ITC, 2005)

Data-driven models for statistical testing: measurements, estimates and residuals. - W. Robert Daasch; Robert Madge (ITC, 2005)

The value of statistical testing for quality, yield and test cost improvement. - Robert Madge; Brady Benware; Mark Ward; W. Robert Daasch (ITC, 2005)

Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. - Chris Schuermyer; Kevin Cota; Robert Madge; Brady Benware (ITC, 2005)

Defect Screening Using Independent Component Analysis on I_DDQ. - Ritesh P. Turakhia; Brady Benware; Robert Madge; Thaddeus T. Shannon; W. Robert Daasch (VTS, 2005)

New test paradigms for yield and manufacturability. - Robert Madge (IEEE Des. Test Comput., 2005)

Making Manufacturing Work For You. - Srikanth Venkataraman; Ruchir Puri; Steve Griffith; Ankush Oberai; Robert Madge; Greg Yeric; Walter Ng; Yervant Zorian (DAC, 2007)