Low-cost industrial technologies of crystalline silicon solar cells. - Jozef Szlufcik; S. Sivoththaman; Johan F. Nijs; Robert P. Mertens 004; Roger Van Overstraeten (Proc. IEEE, 1997)

A Cryogenic ADC operating Down to 4.2K. - Ybe Creten; Patrick Merken; Willy Sansen; Robert Mertens 004; Chris Van Hoof (ISSCC, 2007)

An 8-bit Flash Analog-to-Digital Converter in standard CMOS technology functional in ultra wide temperature range from 4.2 K to 300 K. - Ybe Creten; Patrick Merken; Robert Mertens 004; Willy Sansen; Chris Van Hoof (ESSCIRC, 2008)

Capacitive Power-Management Circuit for Micropower Thermoelectric Generators with a 2.1μW Controller. - Inge Doms; Patrick Merken; Robert P. Mertens 004; Chris Van Hoof (ISSCC, 2008)

Integrated capacitive power-management circuit for thermal harvesters with output power 10 to 1000µW. - Inge Doms; Patrick Merken; Robert Mertens 004; Chris Van Hoof (ISSCC, 2009)

An 8-Bit Flash Analog-to-Digital Converter in Standard CMOS Technology Functional From 4.2 K to 300 K. - Ybe Creten; Patrick Merken; Willy Sansen; Robert P. Mertens 004; Chris Van Hoof (IEEE J. Solid State Circuits, 2009)

Capacitive Power Management Circuit for Micropower Thermoelectric Generators With a 1.4 µA Controller. - Inge Doms; Patrick Merken; Chris Van Hoof; Robert P. Mertens 004 (IEEE J. Solid State Circuits, 2009)

Hydrogel optimization towards fibroblast-friendly biomimetic coatings for implantable devices. - A. Sanchez Linde; John M. O'Callaghan; Maaike Op de Beeck; H. Pereira Neves; Chris Van Hoof; Robert Mertens 004 (EMBC, 2011)

Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology. - Rui Liu; Dominique M. M.-P. Schreurs; Walter De Raedt; Frederik Vanaverbeke; J. Das; Robert Mertens 004; Ingrid De Wolf (Microelectron. Reliab., 2011)

Thermal optimization of GaN-on-Si HEMTs with plastic package. - Rui Liu; Dominique M. M.-P. Schreurs; Walter De Raedt; Frederik Vanaverbeke; Robert Mertens 004; Ingrid De Wolf (Microelectron. Reliab., 2011)

GaN-based HEMTs tested under high temperature storage test. - Denis Marcon; Xuanwu Kang; John Viaene; Marleen Van Hove; Puneet Srivastava; Stefaan Decoutere; Robert Mertens 004; Gustaaf Borghs (Microelectron. Reliab., 2011)