Present and future organisational models for wireless networks. - Robert O'Connor; Sven van der Meer (ISICT, 2003)

Progressive breakdown in ultrathin SiON dielectrics and its effect on transistor performance. - Robert O'Connor; Greg Hughes; Robin Degraeve; Ben Kaczer (Microelectron. Reliab., 2005)

The effect of a post processing thermal anneal on pre-existing and stress induced electrically active defects in ultra-thin SiON dielectric layers. - Robert O'Connor; Greg Hughes (Microelectron. Reliab., 2011)

Reliability of thin ZrO2 gate dielectric layers. - Robert O'Connor; Greg Hughes; Thomas Kauerauf; Lars-Åke Ragnarsson (Microelectron. Reliab., 2011)