Implementing a Built-In Self-Test PLA Design. - Robert P. Treuer; Hideo Fujiwara; Vinod K. Agarwal (IEEE Des. Test, 1985)

A New Built-In Self-Test Design for PLA's with High Fault Coverage and Low Overhead. - Robert P. Treuer; Vinod K. Agarwal; Hideo Fujiwara (IEEE Trans. Computers, 1987)

Fault Location Algorithms for Repairable Embedded. - Robert P. Treuer; Vinod K. Agarwal (ITC, 1993)

Built-In Self-Diagnosis for Repairable Embedded RAMs. - Robert P. Treuer; Vinod K. Agarwal (IEEE Des. Test Comput., 1993)