From specification to measurement: the bottleneck in analog industrial testing. - Robert Van Rijsinge; A. A. R. M. Haggenburg; C. de Vries; Hans Wallinga (ITC, 1990)

Trends in Testing Integrated Circuits. - Bart Vermeulen; Camelia Hora; Bram Kruseman; Erik Jan Marinissen; Robert Van Rijsinge (ITC, 2004)

A Design-Based Structural Test Method for a Switched-Resistor DAC. - Lei Ma; Geert Seuren; Robert Van Rijsinge; Corné Bastiaansen; Leon van der Dussen (J. Electron. Test., 2007)

IoT: Source of test challenges. - Erik Jan Marinissen; Yervant Zorian; Mario Konijnenburg; Chih-Tsun Huang; Ping-Hsuan Hsieh; Peter Cockburn; Jeroen Delvaux; Vladimir Rozic; Bohan Yang 001; Dave Singelée; Ingrid Verbauwhede; Cedric Mayor; et al. (ETS, 2016)