Use of In-Fab Parametric Testing for Process Control of Semiconductor Manufacturing. - Robert W. Atherton; David M. Campbell (ITC, 1983)

Operations Management and Analysis in the Management of Electronic Testing. - Robert W. Atherton; Alfred H. Miller Jr.; Judith E. Dayhoff (ITC, 1983)

Logic Device Characterization Using Computer-Aided Test and Analysis. - Robert W. Atherton; Leonard Ekkelkamp; Chuck Schmitz (ITC, 1984)

Microprocessor Speed Optimization Using Pattern-Recognition Analysis of Parametric Test Data. - Robert W. Atherton; John L. Mudge (ITC, 1985)

Financial Implications of a Detailed Analysis of Test Floor Operations. - Judith E. Dayhoff; Robert W. Atherton (ITC, 1985)

Financial Impact of Tester Reliability Improvements. - Judith E. Dayhoff; Robert W. Atherton (ITC, 1986)

A Model for Wafer Fabrication Dynamics in Integrated Circuit Manufacturing. - Judith E. Dayhoff; Robert W. Atherton (IEEE Trans. Syst. Man Cybern., 1987)

Detailed simulation for semiconductor manufacturing. - Robert W. Atherton; Linda F. Atherton; Mark Pool (WSC, 1990)