Low-Cost Testing of High-Density Logic Components. - Robert W. Bassett; Barry J. Butkus; Stephen L. Dingle; Marc R. Faucher; Pamela S. Gillis; Jeannie H. Panner; John G. Petrovick; Donald L. Wheater (IEEE Des. Test Comput., 1990)

High-Density CMOS Multichip-Module Testing and Diagnosis. - Robert W. Bassett; Pamela S. Gillis; John J. Shushereba (ITC, 1991)

A comprehensive CAD system for high-performance 300 K-circuit ASIC logic chips. - Jeannie H. Panner; Richard P. Abato; Robert W. Bassett; Keith M. Carrig; Pamela S. Gillis; David J. Hathaway; Terrence W. Sehr (IEEE J. Solid State Circuits, 1991)