Robustness in automotive electronics: An industrial overview of major concerns. - Ulrich Backhausen; Oscar Ballan; Paolo Bernardi; Sergio de Luca; Julie Henzler; Thomas Kern; Davide Piumatti; Thomas Rabenalt; Krishnapriya Chakiat Ramamoorthy; Ernesto Sánchez 001; Alessandro Sansonetti; Rudolf Ullmann; et al. (IOLTS, 2017)

Static and dynamic hot carrier accelerated TDDB: Influencing factors and impact on product lifetime. - Rainer Duschl; Armin H. Fischer; Achim Gratz; Robert Wiesner (Microelectron. Reliab., 2017)