16NM 6T and 8T CMOS SRAM Cell Robustness Against Process Variability and Aging Effects. - Roberto B. Almeida; Paulo F. Butzen; Cristina Meinhardt (SBCCI, 2018)

Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies. - Roberto B. Almeida; Cleiton Magano Marques; Paulo F. Butzen; Fábio G. R. G. da Silva; Ricardo A. L. Reis; Cristina Meinhardt (Microelectron. Reliab., 2018)