SCAN/BIST Techniques for Decreasing Test Storage and their implications to Test Pattern Generation. - Roberto Bevacqua; Luca Guerrazzi; Franco Fummi (EUROMICRO, 1996)

Implicit Test Sequences Compaction for Decreasing Test Application Cos. - Roberto Bevacqua; Luca Guerrazzi; Fabrizio Ferrandi; Franco Fummi (ICCD, 1996)