Test of Interconnection Opens Considering Coupling Signals. - Roberto Gómez 001; Alejandro Girón; Víctor H. Champac (DFT, 2005)

A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines. - Roberto Gómez 001; Alejandro Girón; Víctor H. Champac (J. Electron. Test., 2008)

A modern look at the CMOS stuck-open fault. - Roberto Gómez 001; Víctor H. Champac; Chuck Hawkins; Jaume Segura 001 (LATW, 2009)

Testing of Stuck-Open Faults in Nanometer Technologies. - Víctor H. Champac; Julio Vazquez Hernandez; Salvador Barceló; Roberto Gómez 001; Chuck Hawkins; Jaume Segura 001 (IEEE Des. Test Comput., 2012)

Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths. - Hector Villacorta; Charles F. Hawkins; Víctor H. Champac; Jaume Segura 001; Roberto Gómez 001 (IEEE Des. Test, 2013)

An Approach for Optimal Goal Position Assignment in Vehicle Formations. - Luis García-Delgado; Roberto Gómez-Fuentes; Alejandro García-Juárez; Ana Lilia Leal-Cruz; D. Berman-Mendoza; A. Vera-Marquina; A. G. Rojas-Hernández (J. Intell. Robotic Syst., 2014)

Impact of increasing the fin height on soft error rate and static noise margin in a FinFET-based SRAM cell. - Hector Villacorta; Roberto Gómez 001; Sebastià A. Bota; Jaume Segura 001; Víctor H. Champac (LATS, 2015)

Repulsive Function in Potential Field Based Control with Algorithm for Safer Avoidance. - Luis García-Delgado; Jose R. Noriega-Luna; D. Berman-Mendoza; Ana Lilia Leal-Cruz; A. Vera-Marquina; Roberto Gómez-Fuentes; Alejandro García-Juárez; A. G. Rojas-Hernández; Ignacio E. Zaldívar-Huerta (J. Intell. Robotic Syst., 2015)

A metric-guided gate-sizing methodology for aging guardband reduction. - Andres F. Gomez; Roberto Gómez 001; Víctor H. Champac (LATS, 2018)

Identification of Logic Paths Influenced by Severe Coupling Capacitances. - Ivan D. Meza-Ibarra; Víctor H. Champac; Roberto Gómez-Fuentes; Jose R. Noriega-Luna; A. Vera-Marquina (J. Electron. Test., 2020)

Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations. - Víctor H. Champac; Hector Villacorta; Roberto Gómez-Fuentes; Fabian Vargas 001; Jaume Segura 001 (J. Electron. Test., 2024)