Wide bandgap semiconductor devices for switching and microwave power applications. - Roberto Pierobon (2003)

Hot carrier aging degradation phenomena in GaN based MESFETs. - Fabiana Rampazzo; Roberto Pierobon; D. Pacetta; Christophe Gaquière; Didier Théron; Bertrand Boudart; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2004)