Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. - Nicolas Guitard; David Trémouilles; Marise Bafleur; Laurent Escotte; Laurent Bary; Philippe Perdu; Gérard Sarrabayrouse; Nicolas Nolhier; Roberto Reyna-Rojas (Microelectron. Reliab., 2004)

Object Recognition System-on-Chip Using the Support Vector Machines. - Roberto Reyna-Rojas; Dominique Houzet; Daniela Dragomirescu; Florent Carlier; Salim Ouadjaout (EURASIP J. Adv. Signal Process., 2005)