Extraction of scalable electrical model for a SOI JFET using BSIM3 model. - Simona A. Cozzi; Lorenzo Labate; Roberto Stella (Microelectron. J., 2013)

Compact model for parametric instability under arbitrary stress waveform. - Filippo Alagi; Mattia Rossetti; Roberto Stella; Emanuele Viganò; Philippe Raynaud (ESSDERC, 2014)

A reversible first-order dispersive model of parametric instability. - Filippo Alagi; Mattia Rossetti; Roberto Stella; Emanuele Viganò (Microelectron. Reliab., 2014)