Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. - F. Almeida; Paolo Bernardi; D. Calabrese; Marco Restifo; Matteo Sonza Reorda; Davide Appello; Giorgio Pollaccia; Vincenzo Tancorre; Roberto Ugioli; Gulio Zoppi (DDECS, 2019)

Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. - Davide Appello; Paolo Bernardi; Andrea Calabrese; Stefano Littardi; Giorgio Pollaccia; Stefano Quer; Vincenzo Tancorre; Roberto Ugioli (DDECS, 2021)

Innovative methods for Burn-In related Stress Metrics Computation. - Walter Ruggeri; Paolo Bernardi; Stefano Littardi; Matteo Sonza Reorda; Davide Appello; Claudia Bertani; Giorgio Pollaccia; Vincenzo Tancorre; Roberto Ugioli (DTIS, 2021)

Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. - Francesco Angione; Paolo Bernardi; Gabriele Filipponi; Claudia Tempesta; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (DFT, 2022)

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. - Francesco Angione; Davide Appello; J. Aribido; Jyotika Athavale; Nicolò Bellarmino; Paolo Bernardi; Riccardo Cantoro; Corrado De Sio; Tommaso Foscale; Gabriele Gavarini; J. Guerrero; Martin Huch; et al. (ETS, 2022)

An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. - Francesco Angione; Paolo Bernardi; Gabriele Filipponi; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (ETS, 2022)

A novel SEU injection setup for Automotive SoC. - Giusy Iaria; Tommaso Foscale; Paolo Bernardi; Luca Presicce; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (ISIE, 2022)

An innovative Strategy to Quickly Grade Functional Test Programs. - Francesco Angione; Paolo Bernardi; Andrea Calabrese; Lorenzo Cardone; A. Niccoletti; Davide Piumatti; Stefano Quer; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (ITC, 2022)

Parallel Multithread Analysis of Extremely Large Simulation Traces. - Davide Appello; Paolo Bernardi; Andrea Calabrese; Giorgio Pollaccia; Stefano Quer; Vincenzo Tancorre; Roberto Ugioli (IEEE Access, 2022)

A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. - Francesco Angione; Davide Appello; Paolo Bernardi; Andrea Calabrese; Stefano Quer; Matteo Sonza Reorda; Vincenzo Tancorre; Roberto Ugioli (IEEE Access, 2023)

A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. - Francesco Angione; Davide Appello; Paolo Bernardi; Claudia Bertani; Giovambattista Gallo; Stefano Littardi; Giorgio Pollaccia; Walter Ruggeri; Matteo Sonza Reorda; Vincenzo Tancorre; Roberto Ugioli (IEEE Trans. Computers, 2023)