Experimental Verification of a Simple, Intuitive, and Accurate Closed-Form Transfer Function Model for Diverse High-Speed Interconnects. - Kyunghyun Lim; Minsoo Choi 002; Myat Thu Linn Aung; Kyunghwan Kim; Ji-Seong Kim; Rock-Hyun Baek; Ho-Jin Song; Tony Tae-Hyoung Kim; Byungsub Kim (ISOCC, 2018)

Punch-Through-Stopper Free Nanosheet FETs With Crescent Inner-Spacer and Isolated Source/Drain. - Jun-Sik Yoon; Jinsu Jeong; Seunghwan Lee; Rock-Hyun Baek (IEEE Access, 2019)

Bottom Oxide Bulk FinFETs Without Punch-Through-Stopper for Extending Toward 5-nm Node. - Jun-Sik Yoon; Jinsu Jeong; Seunghwan Lee; Rock-Hyun Baek (IEEE Access, 2019)

Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node. - Jun-Sik Yoon; Seunghwan Lee; Junjong Lee; Jinsu Jeong; Hyeok Yun; Bohyeon Kang; Rock-Hyun Baek (IEEE Access, 2019)

Neural Approach for Modeling and Optimizing Si-MOSFET Manufacturing. - Hyun-Chul Choi; Hyeok Yun; Jun-Sik Yoon; Rock-Hyun Baek (IEEE Access, 2020)

Comprehensive Analysis of Source and Drain Recess Depth Variations on Silicon Nanosheet FETs for Sub 5-nm Node SoC Application. - Jinsu Jeong; Jun-Sik Yoon; Seunghwan Lee; Rock-Hyun Baek (IEEE Access, 2020)

Device Design Guideline of 5-nm-Node FinFETs and Nanosheet FETs for Analog/RF Applications. - Jun-Sik Yoon; Rock-Hyun Baek (IEEE Access, 2020)

A Novel Sub-5-nm Node Dual-Workfunction Folded Cascode Nanosheet FETs for Low Power Mobile Applications. - Jun-Sik Yoon; Rock-Hyun Baek (IEEE Access, 2020)

Analysis of TSV-Induced Mechanical Stress and Electrical Noise Coupling in Sub 5-nm Node Nanosheet FETs for Heterogeneous 3D-ICs. - Jinsu Jeong; Jun-Sik Yoon; Rock-Hyun Baek (IEEE Access, 2021)

Monolithic 3D 6T-SRAM Based on Newly Designed Gate and Source/Drain Bottom Contact Schemes. - Junjong Lee; Jun-Sik Yoon; Jinsu Jeong; Seunghwan Lee; Sanguk Lee; Rock-Hyun Baek (IEEE Access, 2021)

Digital/Analog Performance Optimization of Vertical Nanowire FETs Using Machine Learning. - Jun-Sik Yoon; Seunghwan Lee; Hyeok Yun; Rock-Hyun Baek (IEEE Access, 2021)

Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm. - Hyundong Jang; Hyeok Yun; Chanyang Park; Kyeongrae Cho; Kihoon Nam; Jun-Sik Yoon; Hyun-Chul Choi; Rock-Hyun Baek (IEEE Access, 2022)

DC Performance Variations by Grain Boundary in Source/Drain Epitaxy of Sub-3-nm Nanosheet Field-Effect Transistors. - Jun-Sik Yoon; Jinsu Jeong; Seunghwan Lee; Junjong Lee; Sanguk Lee; Jaewan Lim; Rock-Hyun Baek (IEEE Access, 2022)

Arbitrary Font Generation by Encoder Learning of Disentangled Features. - Jeong-Sik Lee; Rock-Hyun Baek; Hyun-Chul Choi (Sensors, 2022)

A Review of Multi-Modal Learning from the Text-Guided Visual Processing Viewpoint. - Ubaid Ullah; Jeong-Sik Lee; Chang-Hyeon An; Hyeonjin Lee; Su-Yeong Park; Rock-Hyun Baek; Hyun-Chul Choi (Sensors, 2022)

Front-side and Back-side Power Delivery Network Guidelines for 2nm node High Perf Computing and Mobile SoC applications. - J. Lee; J. Jeong; S. Lee; S. Lee; J. Lim; S. C. Song; Shashank Ekbote; Nick Stevens-Yu; David Greenlaw; Rock-Hyun Baek (VLSI Technology and Circuits, 2023)

Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning. - Kihoon Nam; Chanyang Park; Hyeok Yun; Jun-Sik Yoon; Hyundong Jang; Kyeongrae Cho; Min Sang Park; Hyun-Chul Choi; Rock-Hyun Baek (IEEE Access, 2023)

Curing Process on Passivation Layer for Backside-Illuminated CMOS Image Sensor Application. - Jongseo Park; Kyeong-Keun Choi; Jehyun An; Bohyeon Kang; Hyeonseo You; Giryun Hong; Sung-Min Ahn; Rock-Hyun Baek (IEEE Access, 2023)

Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development. - Hyeok Yun; Chang-Hyeon An; Hyundong Jang; Kyeongrae Cho; Jeong-Sik Lee; Seungjoon Eom; Choong-Ki Kim; Min-Soo Yoo; Hyun-Chul Choi; Rock-Hyun Baek (Adv. Intell. Syst., 2023)

Modeling of 3D NAND Characteristics for Cross-Temperature by Using Graph Neural Network and Its Application. - Kyeongrae Cho; Jeong-Sik Lee; Chanyang Park; Hyeok Yun; Hyundong Jang; Seungjoon Eom; Min Sang Park; Hyun-Chul Choi; Rock-Hyun Baek (Adv. Intell. Syst., 2023)

FEOL Monolithic Co-Integration of FeFET and CMOS on 8-Inch Wafer Using Laser Spike Annealing With Implementation of an FeFET Inverter. - Bohyeon Kang; Jehyun An; Jongseo Park; Giryun Hong; Beomjoo Ham; Jaeseong Pyo; Sung-Min Ahn; Rock-Hyun Baek (IEEE Access, 2024)

Multi-Task Learning for Real-Time BSIM-CMG Parameter Extraction of NSFETs With Multiple Structural Variations. - Seunghwan Lee; Seungjoon Eom; Jinsu Jeong; Junjong Lee; Sanguk Lee; Hyeok Yun; Yonghwan Ahn; Rock-Hyun Baek (IEEE Access, 2024)

Current-Voltage Modeling of DRAM Cell Transistor Using Genetic Algorithm and Deep Learning. - Jun Hui Park; Jung Nam Kim; Seonhaeng Lee; Gang-Jun Kim; Namhyun Lee; Rock-Hyun Baek; Dae Hwan Kim; Changhyun Kim; Myounggon Kang; Yoon Kim (IEEE Access, 2024)

Cryogenic Body Bias Effect in DRAM Peripheral and Buried-Channel-Array Transistor for Quantum Computing Applications. - Hyunseo You; Kihoon Nam; Jehyun An; Chanyang Park; Donghyun Kim; Seonhaeng Lee; Namhyun Lee; Rock-Hyun Baek (IEEE Access, 2024)

Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation. - Seungjoon Eom; Hyeok Yun; Hyundong Jang; Kyeongrae Cho; Seunghwan Lee; Jinsu Jeong; Rock-Hyun Baek (Adv. Intell. Syst., 2024)

Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring. - Hyeok Yun; Hyundong Jang; Seunghwan Lee; Junjong Lee; Kyeongrae Cho; Seungjoon Eom; Soomin Kim; Choong-Ki Kim; Hong-Chul Byun; Seongjoo Han; Min-Soo Yoo; Rock-Hyun Baek (Adv. Intell. Syst., 2024)

Patterned Multi-Wall Nanosheet FETs for Sustainable Scaling: Zero Gate Extension With Minimal Gate Cut Width. - Sanguk Lee; Jinsu Jeong; Jongseo Park; Seunghwan Lee; Junjong Lee; Yonghwan Ahn; Minchan Kim; Rock-Hyun Baek (IEEE Access, 2025)