BIST Generators for Sequential Faults. - Shujian Zhang; Rod Byrne; D. Michael Miller (ICCD, 1992)

Why Cellular Automata are better than LFSRs as Built-in Self-test Generators for Sequential-type Faults. - Shujian Zhang; Rod Byrne; Jon C. Muzio; D. Michael Miller (ISCAS, 1994)

Quantitative analysis for linear hybrid cellular automata and LFSR as built-in self-test generators for sequential faults. - Shujian Zhang; Rod Byrne; Jon C. Muzio; D. Michael Miller (J. Electron. Test., 1995)

Phon: A Computational Basis for Phonological Database Building and Model Testing. - Yvan Rose; Gregory J. Hedlund; Rod Byrne; Todd Wareham; Brian MacWhinney (Cognitive Aspects of Computational Language Acquisition, 2013)