Testing a multichip package for a consumer communications application. - Alex S. Biewenga; Math Muris; Rodger Schuttert; Urs Fawer (ITC, 1998)

Power pin testing: making the test coverage complete. - Frans G. M. de Jong; Ben Kup; Rodger Schuttert (ITC, 2000)

Improved Test Monitor Circuit in Power Pin DfT. - Rodger Schuttert; Frans G. M. de Jong; Ben Kup (VTS, 2002)

On-Chip Mixed-Signal Test Structures Re-used for Board Test. - Rodger Schuttert; D. C. L. (Erik) van Geest; A. Kumar (ITC, 2004)

Power-scan chain: design for analog testability. - Amir Zjajo; Henk Jan Bergveld; Rodger Schuttert; José Pineda de Gyvez (ITC, 2005)