Treatment of Ventricular Assist Device Test Bench Data for Prediction of Failures and Improved Intrinsic Reliability. - Jeferson C. Dias; Jônatas C. Dias; Edinei P. Legaspe; Rodrigo Lima Stoeterau; Fabrício Junqueira; Newton Maruyama; Lucas Antônio Moscato; Paulo E. Miyagi; Diolino J. Santos Filho (DoCEIS, 2019)