The influence of disturbances in iterative learning control. - Roel J. E. Merry; René van de Molengraft; Maarten Steinbuch (CCA, 2005)

Removing non-repetitive disturbances in iterative learning control by wavelet filtering. - Roel J. E. Merry; René van de Molengraft; Maarten Steinbuch (ACC, 2006)

Control of a high precision stage using a walking piezo actuator. - Roel J. E. Merry; Niels de Kleijn; René van de Molengraft; Maarten Steinbuch (CCA, 2007)

Error modeling and improved position estimation for optical incremental encoders by means of time stamping. - Roel J. E. Merry; René van de Molengraft; Maarten Steinbuch (ACC, 2007)

Iterative Learning Control by Two-Dimensional System Theory applied to a Motion System. - Wojciech Paszke; Roel J. E. Merry; René van de Molengraft (ACC, 2007)

Modeling, identification and control of a metrological Atomic Force Microscope with a 3DOF stage. - Roel J. E. Merry; Mustafa Uyanik; Richard K. Koops; René van de Molengraft; Marijn van Veghel; Maarten Steinbuch (ACC, 2008)

Modeling and compensation of asymmetric hysteresis in a piezo actuated metrological AFM. - Roel J. E. Merry; Mustafa Uyanik; René van de Molengraft; Maarten Steinbuch; Richard K. Koops; Marijn van Veghel (ACC, 2009)

Multivariable control of a metrological Atomic Force Microscope. - Michael J. C. Ronde; Roel J. E. Merry; Marinus Jacobus Gerardus van de Molengraft; Richard K. Koops; Maarten Steinbuch (ECC, 2009)

Delay-varying repetitive control with application to a walking piezo actuator. - Roel J. E. Merry; D. J. Kessels; W. P. M. H. Heemels; M. J. G. van de Molengraft; Maarten Steinbuch (Autom., 2011)

Directional Repetitive Control of a Metrological AFM. - Roel J. E. Merry; Michael J. C. Ronde; René van de Molengraft; Richard K. Koops; Maarten Steinbuch (IEEE Trans. Control. Syst. Technol., 2011)